DESIGN FOR TEST SYSTEM AND BOX LEVEL IMPLEMENTATION FOR RADIO-ELECTRONIC MEANS

Efficient testing strategy is implemented through the creation of a model topology such as Object-Oriented Modeling (OOM) consisting of individual items (Components, I/O Flags, Assemblies, etc.) which are referred to as objects. Such modeling technique utilizes dependency analysis through ports and linkages (nets) between objects with each object typically labeled with a functional description along with assigned properties and attributes. As a result, a test can be created with related coverage of all objects contained in any specified path.


Three major test types can be analyzed – path-based, coverage-based, and complex tests. Path-based tests will determine what components are covered by examining a test point by using relevant dependencies and will cover operational, user-initiated, and probe tests; coverage-based tests determine what specific components can be covered by a defined test strategy without using dependencies and can consist of signature, BIT, and inspection tests; while complex tests may be some combination of path- and coverage-based tests and can include tests for effects, group, and hierarchical tests. Interference analysis is used to help out with test evaluation and diagnostic isolation through upstream (creation), downstream (propagation), and tangential (observation) to the components of interest.


Such modeling features will lead to diagnostic analysis, development of testability metrics, and generation of multiple reports; thus facilitating design and diagnostic optimization through diagnostic conclusion, or hypothesis, establishing what components can be included in the coverage of that test (the ability of the analysis to specify whether a component can be exonerated – proven good, or indicted – suspected of failure). As a result a diagnostic study is presented consisting of a diagnostic flow diagram, an interactive design view, and a testability metrics panel. Isolation can be analyzed either with Common Cause or Multiple-Fault algorithms. In addition, either full isolation analysis of each detection can be performed or it can be learned from each detection test separately when a diagnostics study is run in independent mode.


It is also possible to run diagnostics that is intended to be implemented for sustainment and is aligned with any Test Requirement Document (TRD) flow with a well-defined fault insertion capability.

DIAGNOSTIC CAPABILITY EXAMPLE